As part of the High Value Collections program, the CMSS is developing well described reference collections derived from X-ray photoelectron spectroscopy (XPS) and time-of-the-flight secondary ion mass spectrometry (ToF-SIMS) data that may comprise spectra, maps and depth profiles, stored in proprietary formats.

To provide more value and trust in these collections, the reference datasets and their associated protocols, as data objects, will be connected into other ANFF nodes and shared via the collaborative environment. This project will establish a framework for stronger and deeper collaboration nationally throughout the ANFF node network.